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Filtering by: Keyword atom-probe tomography Keyword silicon Subject Materials Science

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Novel Manufacturing Methods and Mechanical Properties of Semiconductor Nanowires

Description:

Semiconductor nanowires, such as group IV and III-V nanowires, shows distinct electrical, optical and mechanical properties from their bulk counterparts due to their nanoscale size and 1-D morphology. For example, the quantum confinement effect modulates the band gap of a semiconductor nanowire when its diameter approaches or below the exciton...

Keyword:

atom-probe tomography, doping, nanowire, silicon, CVD, and strain

Subject:

Nanotechnology, Nanoscience, and Materials Science

Creator:

Sun, Zhiyuan

Owner:

Scholarly Digital Publishing

Language:

en

Date Uploaded:

02/12/2020

Date Created:

2018-01-01

Resource Type:

Dissertation

Alternate Identifier:

http://dissertations.umi.com/northwestern:14424 and etdadmin_upload_622561